| Document Type
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BL
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| Record Number
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971045
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| Doc. No
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b725415
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| Title & Author
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Advances in imaging and electron physics.\ edited by Peter W. Hawkes.
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| Publication Statement
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Amsterdam ;Boston :: Elsevier Academic Press,, ©2005.
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| Series Statement
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Advances in imaging and electron physics,; 135
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| Page. NO
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1 online resource (xv, 347 pages) :: illustrations.
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| ISBN
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0080458548
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: 0120147777
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: 9780080458540
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: 9780120147779
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| Bibliographies/Indexes
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Includes bibliographical references and index.
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| Contents
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Cover -- front cover -- copyright -- table of contents -- Contributors -- Preface -- Future Contributions -- Optics, Mechanics, and Hamilton-Jacobi Skeletons -- I. INTRODUCTION -- II. PROPERTIES OF SKELETONS -- III. SKELETONIZATION TECHNIQUES -- IV. OPTICS, MECHANICS, AND HAMILTON-JACOBI SKELETONS -- V. HOMOTOPY-PRESERVING MEDIAL SETS -- VI. EXAMPLES -- VII. CONCLUSION -- ACKNOWLEDGMENTS -- REFERENCES -- Dynamic Force Microscopy and Spectroscopy -- I. INTRODUCTION TO DYNAMIC FORCE MICROSCOPY -- II. DYNAMIC FORCE MICROSCOPY IN AIR AND LIQUIDS -- III. NONCONTACT AFM IN VACUUM -- IV. DYNAMIC FORCE SPECTROSCOPY -- V. CONCLUSION -- ACKNOWLEDGMENTS -- REFERENCES -- Generalized Almost-Cyclostationary Signals -- I. INTRODUCTION -- II. HIGHER-ORDER CHARACTERIZATION -- III. LINEAR TIME-VARIANT TRANSFORMATIONS OF GACS SIGNALS -- IV. SAMPLING OF GACS SIGNALS -- V. TIME-FREQUENCY REPRESENTATIONS OF GACS SIGNALS -- APPENDICES -- A -- B -- C -- D -- REFERENCES -- Virtual Optical Experiments -- I. INTRODUCTION -- II. MODULATION OF THE REFRACTIVE INDEX -- III. MEASUREMENT TECHNIQUES -- IV. MODELING OPTICAL PROBING TECHNIQUES -- V. VIRTUAL EXPERIMENTS AND THE OPTIMIZATION STRATEGY -- VI. FREE CARRIER ABSORPTION MEASUREMENTS -- VII. INTERNAL LASER DEFLECTION MEASUREMENTS -- VIII. INTERFEROMETRIC TECHNIQUES -- IX. CONCLUSION AND OUTLOOK -- REFERENCES -- Index -- Last Page.
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| Abstract
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Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Atomic force microscopy.
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Cyclostationary waves.
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Image processing.
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Semiconductor lasers.
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Spectrum analysis.
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Atomic force microscopy.
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Cyclostationary waves.
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Image processing.
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SCIENCE-- Physics-- Electricity.
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SCIENCE-- Physics-- Electromagnetism.
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Semiconductor lasers.
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Spectrum analysis.
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| Dewey Classification
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537.5/6
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| LC Classification
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QC793.5.E62A38eb vol. 135
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| Added Entry
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Hawkes, P. W.
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