Scanning electron microscopy and x-ray microanalysis /

منو

" Scanning electron microscopy and x-ray microanalysis / "
Joseph I. Goldstein [and others].

Document Type	:	BL
Record Number	:	977315
Doc. No	:	b731685
Title & Author	:	Scanning electron microscopy and x-ray microanalysis /\ Joseph I. Goldstein [and others].
Edition Statement	:	3rd ed.
Publication Statement	:	New York :: Kluwer Academic/Plenum Publishers,, ©2003.
Page. NO	:	xix, 689 pages :: illustrations (some color) ;; 26 cm ++ 1 CD-ROM (4 3/4 in.)
ISBN	:	0306472929
	:	: 9780306472923
Bibliographies/Indexes	:	Includes bibliographical references and index.
Abstract	:	Accompanying CD-ROM includes ... "a database of useful parameters for SEM and X-ray microanalysis calculations and enhancements to the text chapters."--Page 4 of cover.
Subject	:	Scanning electron microscopy.
Subject	:	X-ray microanalysis.
Subject	:	Electron Probe Microanalysis.
Subject	:	Microscopy, Electron, Scanning.
Subject	:	Microanalyse aux rayons X.
Subject	:	Microscopie électronique à balayage.
Subject	:	ELECTRON MICROSCOPY.
Subject	:	Elektronenstrahlmikroanalyse
Subject	:	MICROANALYSIS.
Subject	:	Rasterelektronenmikroskopie
Subject	:	Scanning electron microscopy.
Subject	:	SCANNING ELECTRON MICROSCOPY.
Subject	:	X RAY ANALYSIS.
Subject	:	X-ray microanalysis.
Dewey Classification	:	‭502/.8/25‬
LC Classification	:	‭QH212.S3‬‭S29 2003‬
NLM classification	:	‭QH 212.S3‬‭S283 2003‬
	:	‭51.22‬bcl
	:	‭CHE 264f‬stub
	:	‭PHY 135f‬stub
	:	‭UH 6310‬rvk
	:	‭UH 6320‬rvk
Added Entry	:	Goldstein, Joseph,1939-

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