| Document Type
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BL
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| Record Number
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979335
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| Doc. No
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b733705
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| Main Entry
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Holt, D. B.
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| Title & Author
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Extended defects in semiconductors : : electronic properties, device effects and structures /\ D.B. Holt, B.G. Yacobi.
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| Publication Statement
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Cambridge ;New York :: Cambridge University Press,, 2007.
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| Page. NO
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1 online resource (xi, 631 pages) :: illustrations
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| ISBN
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0511276885
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: 0511278683
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: 0511279280
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: 0511321716
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: 051153485X
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: 0521819342
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: 1107424143
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: 9780511276880
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: 9780511278686
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: 9780511279287
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: 9780511321719
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: 9780511534850
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: 9780521819343
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: 9781107424142
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| Bibliographies/Indexes
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Includes bibliographical references and index.
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| Contents
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1. Semiconducting materials; 2. An introduction to extended defects; 3. Characterization of extended defects in semiconductors; 4. Core structures and mechanical effects of extended defects specific to semiconductors; 5. The electrical, optical and device effects of dislocations and grain boundaries; 6. Point defect materials problems.
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| Abstract
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"This book surveys the properties, effects, roles and characterization of structurally extended defects in semiconductors. The basic properties of extended defects are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices and techniques for their characterization are discussed. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics."--Jacket.
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| Subject
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Semiconductors-- Defects.
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Semiconducteurs-- Défauts.
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Gitterbaufehler
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Halbleiter
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Semiconductors-- Defects.
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TECHNOLOGY ENGINEERING-- Electronics-- Semiconductors.
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TECHNOLOGY ENGINEERING-- Electronics-- Solid State.
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Gitterbaufehler.
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Halbleiter.
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| Dewey Classification
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621.3815/2
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| LC Classification
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TK7871.852.H65 2007eb
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| NLM classification
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UP 2100rvk
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UP 2100.rvk
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UQ 2400rvk
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UQ 2400.rvk
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| Added Entry
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Yacobi, B. G.
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