| Document Type
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BL
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| Record Number
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979780
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b734150
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| Title & Author
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Advances in imaging and electron physics.\ edited by Peter W. Hawkes.
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| Publication Statement
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San Diego :: Academic Press,, ©1998.
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| Series Statement
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Advances in imaging and electron physics,; 102
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| Page. NO
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1 online resource (xii, 330 pages) :: illustrations.
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| ISBN
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0080577687
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: 0120147440
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: 1281456241
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: 6611456244
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: 9780080577685
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: 9780120147441
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: 9781281456243
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: 9786611456245
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| Bibliographies/Indexes
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Includes bibliographical references and index.
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| Contents
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Front Cover; Advances in Imaging and Electron Physics, Volume 102; Copyright Page; Contents; Contributors; Preface; Chapter 1. Finite Element Methods for the Solution of 3D Eddy Current Problems; I. Introduction; II. Field Equations and Material Properties; III. Fields, Potentials, and Gauges; IV. Edge Elements for 3D Field Problems and Vector Potentials; V. Integral Formulations for Linear and Nonlinear Eddy Currents; VI. Differential Formulations and Constitutive Error Approach; VII. Discussion and Conclusions; References; Chapter 2. Nanofabrication for Electronics; I. Introduction
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II. Nanofabrication MethodsIII. Pattern Transfer; IV. Resolution Limit of Organic Resists; V. Applications of Nanostructures; VI. Conclusion; References; Chapter 3. Miniature Electron Optics; I. Introduction; II. Scaling Laws for Electrostatic Lenses; III. Fabrication of Miniature Electrostatic Lenses; IV. Fabrication of Miniature Magnetostatic Lenses; V. Electron Source; VI. Detector; VII. Electron Optical Calculations; VIII. Performance of a Stacked Einzel Lens; IX. Summary and Future Prospects; References; Chapter 4. Optical Interconnection Networks; I. Introduction
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II. Optical Interconnect TypesIII. Architectures; IV. Applications; V. Packaging of Optical Interconnects; VI. Problems and Possibilities; VII. Conclusions; References; Chapter 5. Aspects of Mirror Electron Microscopy; I. Resolution of the Mirror Electron Microscope; II. Distortion of Details of Object Image under Observation in a Mirror Electron Microscope; III. Limiting Sensitivity of a Mirror Electron Microscope for Observation of Steps on an Object; VI. Image of Islands on an Object Surface in Mirror Electron Microscopy
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V. Calculation of Image Contrast in a Mirror Electron Microscope in the Focused Operation ModeReferences; Index
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| Abstract
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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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| Subject
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Electron microscopsy.
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Electronics.
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Electrons.
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Electronics.
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Electrons.
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Images, traitement des.
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Infographie.
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TECHNOLOGY ENGINEERING-- Electrical.
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| Dewey Classification
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621.38
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| LC Classification
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TK7800.A37eb vol. 102
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| Added Entry
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Hawkes, P. W.
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