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" CTL for test information of digital ICs / "


Document Type : BL
Record Number : 993799
Doc. No : b748169
Main Entry : Kapur, Rohit.
Title & Author : CTL for test information of digital ICs /\ by Rohit Kapur.
Publication Statement : Boston :: Kluwer Academic Publishers,, 2003.
Page. NO : 1 online resource (ix, 173 pages) :: illustrations
ISBN : 0306478269
: : 1402072937
: : 9780306478260
: : 9781402072932
: 1402072937
Subject : Computer hardware description languages.
Subject : Digital integrated circuits-- Testing-- Standards.
Subject : Computer hardware description languages.
Subject : TECHNOLOGY ENGINEERING-- Electronics-- Circuits-- General.
Subject : TECHNOLOGY ENGINEERING-- Electronics-- Circuits-- Integrated.
Dewey Classification : ‭621.3815/48‬
LC Classification : ‭TK7874.65‬‭.K35 2003eb‬
NLM classification : ‭53.57‬bcl
copyhttps://lib.clisel.com/site/catalogue/993799
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